Stability of photovoltage and trap of light-induced charges in ferroelectric W O3 -doped (Pb0.97 La0.03) (Zr0.52 Ti0.48) O3 thin films
10.1063/1.2776855
Saved in:
Main Authors: | , , , |
---|---|
Other Authors: | |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/57503 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
id |
sg-nus-scholar.10635-57503 |
---|---|
record_format |
dspace |
spelling |
sg-nus-scholar.10635-575032024-11-11T08:20:52Z Stability of photovoltage and trap of light-induced charges in ferroelectric W O3 -doped (Pb0.97 La0.03) (Zr0.52 Ti0.48) O3 thin films Qin, M. Yao, K. Liang, Y.C. Gan, B.K. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.2776855 Applied Physics Letters 91 9 - APPLA 2014-06-17T03:06:55Z 2014-06-17T03:06:55Z 2007 Article Qin, M., Yao, K., Liang, Y.C., Gan, B.K. (2007). Stability of photovoltage and trap of light-induced charges in ferroelectric W O3 -doped (Pb0.97 La0.03) (Zr0.52 Ti0.48) O3 thin films. Applied Physics Letters 91 (9) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2776855 00036951 http://scholarbank.nus.edu.sg/handle/10635/57503 000249156100084 Scopus |
institution |
National University of Singapore |
building |
NUS Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NUS Library |
collection |
ScholarBank@NUS |
description |
10.1063/1.2776855 |
author2 |
ELECTRICAL & COMPUTER ENGINEERING |
author_facet |
ELECTRICAL & COMPUTER ENGINEERING Qin, M. Yao, K. Liang, Y.C. Gan, B.K. |
format |
Article |
author |
Qin, M. Yao, K. Liang, Y.C. Gan, B.K. |
spellingShingle |
Qin, M. Yao, K. Liang, Y.C. Gan, B.K. Stability of photovoltage and trap of light-induced charges in ferroelectric W O3 -doped (Pb0.97 La0.03) (Zr0.52 Ti0.48) O3 thin films |
author_sort |
Qin, M. |
title |
Stability of photovoltage and trap of light-induced charges in ferroelectric W O3 -doped (Pb0.97 La0.03) (Zr0.52 Ti0.48) O3 thin films |
title_short |
Stability of photovoltage and trap of light-induced charges in ferroelectric W O3 -doped (Pb0.97 La0.03) (Zr0.52 Ti0.48) O3 thin films |
title_full |
Stability of photovoltage and trap of light-induced charges in ferroelectric W O3 -doped (Pb0.97 La0.03) (Zr0.52 Ti0.48) O3 thin films |
title_fullStr |
Stability of photovoltage and trap of light-induced charges in ferroelectric W O3 -doped (Pb0.97 La0.03) (Zr0.52 Ti0.48) O3 thin films |
title_full_unstemmed |
Stability of photovoltage and trap of light-induced charges in ferroelectric W O3 -doped (Pb0.97 La0.03) (Zr0.52 Ti0.48) O3 thin films |
title_sort |
stability of photovoltage and trap of light-induced charges in ferroelectric w o3 -doped (pb0.97 la0.03) (zr0.52 ti0.48) o3 thin films |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/57503 |
_version_ |
1821196364287049728 |