The effect of interlayers on magnetoresistance and exchange coupling in magnetic tunnel junctions

10.1016/S0304-8853(03)00484-0

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Bibliographic Details
Main Authors: Hu, J.F., Ng, V., Wang, J.P., Chong, T.C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/57613
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Institution: National University of Singapore