Extended depth of focus in a particle field measurement using a single-shot digital hologram
10.1063/1.3263141
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sg-nus-scholar.10635-602662023-10-30T20:23:54Z Extended depth of focus in a particle field measurement using a single-shot digital hologram Chen, W. Quan, C. Tay, C.J. MECHANICAL ENGINEERING 10.1063/1.3263141 Applied Physics Letters 95 20 - APPLA 2014-06-17T06:21:10Z 2014-06-17T06:21:10Z 2009 Article Chen, W., Quan, C., Tay, C.J. (2009). Extended depth of focus in a particle field measurement using a single-shot digital hologram. Applied Physics Letters 95 (20) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3263141 00036951 http://scholarbank.nus.edu.sg/handle/10635/60266 000272052200003 Scopus |
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10.1063/1.3263141 |
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MECHANICAL ENGINEERING |
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MECHANICAL ENGINEERING Chen, W. Quan, C. Tay, C.J. |
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Article |
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Chen, W. Quan, C. Tay, C.J. |
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Chen, W. Quan, C. Tay, C.J. Extended depth of focus in a particle field measurement using a single-shot digital hologram |
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Chen, W. |
title |
Extended depth of focus in a particle field measurement using a single-shot digital hologram |
title_short |
Extended depth of focus in a particle field measurement using a single-shot digital hologram |
title_full |
Extended depth of focus in a particle field measurement using a single-shot digital hologram |
title_fullStr |
Extended depth of focus in a particle field measurement using a single-shot digital hologram |
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Extended depth of focus in a particle field measurement using a single-shot digital hologram |
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extended depth of focus in a particle field measurement using a single-shot digital hologram |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/60266 |
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