Flank wear measurement by a threshold independent method with sub-pixel accuracy

Flank wear measurement by a threshold independent method with sub-pixel accuracy

10.1016/j.ijmachtools.2005.04.006

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Bibliographic Details
Main Authors: Wang, W.H., Hong, G.S., Wong, Y.S.
Other Authors: MECHANICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Flank wear measurement
Image processing
Machine vision
Milling
Tool wear
Online Access:http://scholarbank.nus.edu.sg/handle/10635/60330
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/60330

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