A two-dimensional impulse noise model and error probability of QAM in DSL

10.1109/TCOMM.2003.809221

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Bibliographic Details
Main Authors: Tan, S.Y., Chew, Y.H., Tjhung, T.T., Wu, M.W.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/61728
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Institution: National University of Singapore