Approximate results for the bit error probability of binary phase shift keying with noisy phase reference

10.1109/26.231929

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Bibliographic Details
Main Authors: Kam, Pooi Yuen, Teo, Seow Khye, Some, Yew Kong, Tjhung, Tjeng Thiang
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/61860
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Institution: National University of Singapore
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Summary:10.1109/26.231929