Closed-form error probability formula for narrow-band FSK, with limiter-discriminator-integrator detection, in Rayleigh fading

• Main Authors: Ng, Chun S., Tjhung, Tjeng T., Adachi, Fumiyuki, Chin, Francois P.S.
• Other Authors: ELECTRICAL ENGINEERING
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/61941
• Institution: National University of Singapore

10.1109/26.328949