Determining substrate orientation using a high-resolution diffractometer

Journal of Crystal Growth

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Main Authors: Halliwell, M.A.G., Chua, S.J.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62031
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Institution: National University of Singapore
id sg-nus-scholar.10635-62031
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spelling sg-nus-scholar.10635-620312015-03-21T06:44:41Z Determining substrate orientation using a high-resolution diffractometer Halliwell, M.A.G. Chua, S.J. ELECTRICAL ENGINEERING Journal of Crystal Growth 192 3-4 456-461 JCRGA 2014-06-17T06:46:39Z 2014-06-17T06:46:39Z 1998-09-01 Article Halliwell, M.A.G.,Chua, S.J. (1998-09-01). Determining substrate orientation using a high-resolution diffractometer. Journal of Crystal Growth 192 (3-4) : 456-461. ScholarBank@NUS Repository. 00220248 http://scholarbank.nus.edu.sg/handle/10635/62031 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Journal of Crystal Growth
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Halliwell, M.A.G.
Chua, S.J.
format Article
author Halliwell, M.A.G.
Chua, S.J.
spellingShingle Halliwell, M.A.G.
Chua, S.J.
Determining substrate orientation using a high-resolution diffractometer
author_sort Halliwell, M.A.G.
title Determining substrate orientation using a high-resolution diffractometer
title_short Determining substrate orientation using a high-resolution diffractometer
title_full Determining substrate orientation using a high-resolution diffractometer
title_fullStr Determining substrate orientation using a high-resolution diffractometer
title_full_unstemmed Determining substrate orientation using a high-resolution diffractometer
title_sort determining substrate orientation using a high-resolution diffractometer
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/62031
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