Efficient four-standard calibration procedure for six-port reflectometers

Conference Record - IEEE Instrumentation and Measurement Technology Conference

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Bibliographic Details
Main Authors: Qiao, L., Yeo, S.P.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62110
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Institution: National University of Singapore
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Summary:Conference Record - IEEE Instrumentation and Measurement Technology Conference