Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing

Physica Status Solidi (A) Applied Research

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Main Authors:	Choi, W.K., Poon, F.W.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62114
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-62114
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spelling	sg-nus-scholar.10635-621142015-04-06T05:01:41Z Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing Choi, W.K. Poon, F.W. ELECTRICAL ENGINEERING Physica Status Solidi (A) Applied Research 163 1 129-140 PSSAB 2014-06-17T06:47:33Z 2014-06-17T06:47:33Z 1997-09 Article Choi, W.K.,Poon, F.W. (1997-09). Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing. Physica Status Solidi (A) Applied Research 163 (1) : 129-140. ScholarBank@NUS Repository. 00318965 http://scholarbank.nus.edu.sg/handle/10635/62114 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Physica Status Solidi (A) Applied Research
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Choi, W.K. Poon, F.W.
format	Article
author	Choi, W.K. Poon, F.W.
spellingShingle	Choi, W.K. Poon, F.W. Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing
author_sort	Choi, W.K.
title	Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing
title_short	Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing
title_full	Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing
title_fullStr	Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing
title_full_unstemmed	Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing
title_sort	electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/62114
_version_	1681085716676739072

Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealing

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