APA引文

Pan, Y., & ENGINEERING, E. (2014). Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's.

Chicago Style Citation

Pan, Y., and ELECTRICAL ENGINEERING. Experimental Study of the Fowler-Nordheim Tunneling Induced Degradation of LDD PMOSFET's. 2014.

MLA引文

Pan, Y., and ELECTRICAL ENGINEERING. Experimental Study of the Fowler-Nordheim Tunneling Induced Degradation of LDD PMOSFET's. 2014.

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