發送短信 : Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's

 _    _      ___     ______     ______    ______  
| || | ||   / _ \\  |      \\  /_   _//  /_   _// 
| || | ||  | / \ || |  --  //   -| ||-     | ||   
| \\_/ ||  | \_/ || |  --  \\   _| ||_    _| ||   
 \____//    \___//  |______//  /_____//  /__//    
  `---`     `---`   `------`   `-----`   `--`