Investigation of dislocations and traps in MBE grown p-InGaAs/GaAs heterostructures

Investigation of dislocations and traps in MBE grown p-InGaAs/GaAs heterostructures

Thin Solid Films

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Bibliographic Details
Main Authors: Du, A.Y., Li, M.F., Chong, T.C., Xu, S.J., Zhang, Z., Yu, D.P.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Dislocations
GaAs heterostructures
Lattice
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62354
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/62354

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