REFRACTOMETRY THROUGH OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY.

Electronics Letters

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Bibliographic Details
Main Authors: Tjhung, T.T., Teo, S.K., Mendis, F.V.C., Selvan, B.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62699
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Institution: National University of Singapore
Description
Summary:Electronics Letters