Structural identification of static-security assessment problems using self-organising and associative memory

Structural identification of static-security assessment problems using self-organising and associative memory

International Journal of Engineering Intelligent Systems for Electrical Engineering and Communications

Saved in:
Bibliographic Details
Main Author: Chang, C.S.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Multilayer feedforward neural network
Pattern database
Self-organising map
Static security
Structural identification and voltage prediction
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62820
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:International Journal of Engineering Intelligent Systems for Electrical Engineering and Communications

Similar Items