Transit time effect in electron beam testing voltage measurements
Measurement Science and Technology
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sg-nus-scholar.10635-628922023-08-22T08:01:02Z Transit time effect in electron beam testing voltage measurements Thong, J.T.L. ELECTRICAL ENGINEERING Measurement Science and Technology 3 9 827-837 MSTCE 2014-06-17T06:56:01Z 2014-06-17T06:56:01Z 1992-09 Article Thong, J.T.L. (1992-09). Transit time effect in electron beam testing voltage measurements. Measurement Science and Technology 3 (9) : 827-837. ScholarBank@NUS Repository. 09570233 http://scholarbank.nus.edu.sg/handle/10635/62892 A1992JM00500006 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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ScholarBank@NUS |
| description |
Measurement Science and Technology |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Thong, J.T.L. |
| format |
Article |
| author |
Thong, J.T.L. |
| spellingShingle |
Thong, J.T.L. Transit time effect in electron beam testing voltage measurements |
| author_sort |
Thong, J.T.L. |
| title |
Transit time effect in electron beam testing voltage measurements |
| title_short |
Transit time effect in electron beam testing voltage measurements |
| title_full |
Transit time effect in electron beam testing voltage measurements |
| title_fullStr |
Transit time effect in electron beam testing voltage measurements |
| title_full_unstemmed |
Transit time effect in electron beam testing voltage measurements |
| title_sort |
transit time effect in electron beam testing voltage measurements |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/62892 |
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