A sequential constant-stress accelerated life testing scheme and its Bayesian inference

10.1002/qre.958

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Bibliographic Details
Main Authors: Liu, X., Tang, L.-C.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62950
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Institution: National University of Singapore
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