Graphical analysis for Birnbaum-Saunders distribution

Microelectronics Reliability

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Bibliographic Details
Main Authors: Chang, D.S., Tang, L.C.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63146
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Institution: National University of Singapore

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