Planning environmental stress-screening based on DOD-HDBK-344 - A case study
10.1016/0026-2714(95)00181-Z
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sg-nus-scholar.10635-632602015-01-06T18:46:24Z Planning environmental stress-screening based on DOD-HDBK-344 - A case study Mok, Y.L. Xie, M. Goh, T.N. INDUSTRIAL & SYSTEMS ENGINEERING 10.1016/0026-2714(95)00181-Z Microelectronics Reliability 36 1 83-90 MCRLA 2014-06-17T07:02:00Z 2014-06-17T07:02:00Z 1996-01 Article Mok, Y.L.,Xie, M.,Goh, T.N. (1996-01). Planning environmental stress-screening based on DOD-HDBK-344 - A case study. Microelectronics Reliability 36 (1) : 83-90. ScholarBank@NUS Repository. <a href="https://doi.org/10.1016/0026-2714(95)00181-Z" target="_blank">https://doi.org/10.1016/0026-2714(95)00181-Z</a> 00262714 http://scholarbank.nus.edu.sg/handle/10635/63260 NOT_IN_WOS Scopus |
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| description |
10.1016/0026-2714(95)00181-Z |
| author2 |
INDUSTRIAL & SYSTEMS ENGINEERING |
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INDUSTRIAL & SYSTEMS ENGINEERING Mok, Y.L. Xie, M. Goh, T.N. |
| format |
Article |
| author |
Mok, Y.L. Xie, M. Goh, T.N. |
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Mok, Y.L. Xie, M. Goh, T.N. Planning environmental stress-screening based on DOD-HDBK-344 - A case study |
| author_sort |
Mok, Y.L. |
| title |
Planning environmental stress-screening based on DOD-HDBK-344 - A case study |
| title_short |
Planning environmental stress-screening based on DOD-HDBK-344 - A case study |
| title_full |
Planning environmental stress-screening based on DOD-HDBK-344 - A case study |
| title_fullStr |
Planning environmental stress-screening based on DOD-HDBK-344 - A case study |
| title_full_unstemmed |
Planning environmental stress-screening based on DOD-HDBK-344 - A case study |
| title_sort |
planning environmental stress-screening based on dod-hdbk-344 - a case study |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/63260 |
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