Selecting the most reliable population under step-stress accelerated life test

Selecting the most reliable population under step-stress accelerated life test

International Journal of Reliability, Quality and Safety Engineering

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Bibliographic Details
Main Authors: Tang, L.C., Sun, Y.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Constant stress
Least favorable configuration
Order statistic
Reliability
Step stress
Weibull distribution
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63305
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/63305

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