Study of microimpurities and charge states in homogeneous hydrocarbon films (Redeposited from a T-10 tokamak deuterium plasma discharge) using XRF analysis, IR spectroscopy, EPR, and I-V characteristics

10.1134/S1027451008060025

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Main Authors:	Svechnikov, N.Y., Stankevich, V.G., Men'shikov, K.A., Lebedev, A.M., Kolbasov, B.N., Trunova, V.A., Rajarathnam, D., Kostetski, Y.
Other Authors:	BIOENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/64625
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-646252023-10-26T08:57:51Z Study of microimpurities and charge states in homogeneous hydrocarbon films (Redeposited from a T-10 tokamak deuterium plasma discharge) using XRF analysis, IR spectroscopy, EPR, and I-V characteristics Svechnikov, N.Y. Stankevich, V.G. Men'shikov, K.A. Lebedev, A.M. Kolbasov, B.N. Trunova, V.A. Rajarathnam, D. Kostetski, Y. BIOENGINEERING CHEMICAL & BIOMOLECULAR ENGINEERING 10.1134/S1027451008060025 Journal of Surface Investigation 2 6 826-835 2014-06-17T07:49:25Z 2014-06-17T07:49:25Z 2008-12 Article Svechnikov, N.Y., Stankevich, V.G., Men'shikov, K.A., Lebedev, A.M., Kolbasov, B.N., Trunova, V.A., Rajarathnam, D., Kostetski, Y. (2008-12). Study of microimpurities and charge states in homogeneous hydrocarbon films (Redeposited from a T-10 tokamak deuterium plasma discharge) using XRF analysis, IR spectroscopy, EPR, and I-V characteristics. Journal of Surface Investigation 2 (6) : 826-835. ScholarBank@NUS Repository. https://doi.org/10.1134/S1027451008060025 10274510 http://scholarbank.nus.edu.sg/handle/10635/64625 000262864900002 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1134/S1027451008060025
author2	BIOENGINEERING
author_facet	BIOENGINEERING Svechnikov, N.Y. Stankevich, V.G. Men'shikov, K.A. Lebedev, A.M. Kolbasov, B.N. Trunova, V.A. Rajarathnam, D. Kostetski, Y.
format	Article
author	Svechnikov, N.Y. Stankevich, V.G. Men'shikov, K.A. Lebedev, A.M. Kolbasov, B.N. Trunova, V.A. Rajarathnam, D. Kostetski, Y.
spellingShingle	Svechnikov, N.Y. Stankevich, V.G. Men'shikov, K.A. Lebedev, A.M. Kolbasov, B.N. Trunova, V.A. Rajarathnam, D. Kostetski, Y. Study of microimpurities and charge states in homogeneous hydrocarbon films (Redeposited from a T-10 tokamak deuterium plasma discharge) using XRF analysis, IR spectroscopy, EPR, and I-V characteristics
author_sort	Svechnikov, N.Y.
title	Study of microimpurities and charge states in homogeneous hydrocarbon films (Redeposited from a T-10 tokamak deuterium plasma discharge) using XRF analysis, IR spectroscopy, EPR, and I-V characteristics
title_short	Study of microimpurities and charge states in homogeneous hydrocarbon films (Redeposited from a T-10 tokamak deuterium plasma discharge) using XRF analysis, IR spectroscopy, EPR, and I-V characteristics
title_full	Study of microimpurities and charge states in homogeneous hydrocarbon films (Redeposited from a T-10 tokamak deuterium plasma discharge) using XRF analysis, IR spectroscopy, EPR, and I-V characteristics
title_fullStr	Study of microimpurities and charge states in homogeneous hydrocarbon films (Redeposited from a T-10 tokamak deuterium plasma discharge) using XRF analysis, IR spectroscopy, EPR, and I-V characteristics
title_full_unstemmed	Study of microimpurities and charge states in homogeneous hydrocarbon films (Redeposited from a T-10 tokamak deuterium plasma discharge) using XRF analysis, IR spectroscopy, EPR, and I-V characteristics
title_sort	study of microimpurities and charge states in homogeneous hydrocarbon films (redeposited from a t-10 tokamak deuterium plasma discharge) using xrf analysis, ir spectroscopy, epr, and i-v characteristics
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/64625
_version_	1781782457714999296

Study of microimpurities and charge states in homogeneous hydrocarbon films (Redeposited from a T-10 tokamak deuterium plasma discharge) using XRF analysis, IR spectroscopy, EPR, and I-V characteristics

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