Effects of using a metal layer in total internal reflection fluorescence microscopy
10.1007/s00339-007-4119-1
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sg-nus-scholar.10635-670222023-10-27T07:10:58Z Effects of using a metal layer in total internal reflection fluorescence microscopy Tang, W.T. Chung, E. Kim, Y. So, P.T.C. Sheppard, C.J.R. BIOENGINEERING 10.1007/s00339-007-4119-1 Applied Physics A: Materials Science and Processing 89 2 333-335 APAMF 2014-06-17T09:43:29Z 2014-06-17T09:43:29Z 2007-11 Article Tang, W.T., Chung, E., Kim, Y., So, P.T.C., Sheppard, C.J.R. (2007-11). Effects of using a metal layer in total internal reflection fluorescence microscopy. Applied Physics A: Materials Science and Processing 89 (2) : 333-335. ScholarBank@NUS Repository. https://doi.org/10.1007/s00339-007-4119-1 09478396 http://scholarbank.nus.edu.sg/handle/10635/67022 000249016500018 Scopus |
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BIOENGINEERING Tang, W.T. Chung, E. Kim, Y. So, P.T.C. Sheppard, C.J.R. |
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Tang, W.T. Chung, E. Kim, Y. So, P.T.C. Sheppard, C.J.R. |
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Tang, W.T. Chung, E. Kim, Y. So, P.T.C. Sheppard, C.J.R. Effects of using a metal layer in total internal reflection fluorescence microscopy |
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Tang, W.T. |
title |
Effects of using a metal layer in total internal reflection fluorescence microscopy |
title_short |
Effects of using a metal layer in total internal reflection fluorescence microscopy |
title_full |
Effects of using a metal layer in total internal reflection fluorescence microscopy |
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Effects of using a metal layer in total internal reflection fluorescence microscopy |
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Effects of using a metal layer in total internal reflection fluorescence microscopy |
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effects of using a metal layer in total internal reflection fluorescence microscopy |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/67022 |
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