White-light interference microscopy: A way to obtain high lateral resolution over an extended range of heights

10.1364/OE.14.006788

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Bibliographic Details
Main Authors: Roy, M., Sheppard, C.J.R., Cox, G., Hariharan, P.
Other Authors: BIOENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/67349
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-673492023-10-29T22:58:46Z White-light interference microscopy: A way to obtain high lateral resolution over an extended range of heights Roy, M. Sheppard, C.J.R. Cox, G. Hariharan, P. BIOENGINEERING 10.1364/OE.14.006788 Optics Express 14 15 6788-6793 2014-06-17T09:47:28Z 2014-06-17T09:47:28Z 2006 Article Roy, M., Sheppard, C.J.R., Cox, G., Hariharan, P. (2006). White-light interference microscopy: A way to obtain high lateral resolution over an extended range of heights. Optics Express 14 (15) : 6788-6793. ScholarBank@NUS Repository. https://doi.org/10.1364/OE.14.006788 10944087 http://scholarbank.nus.edu.sg/handle/10635/67349 000239342300023 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1364/OE.14.006788
author2 BIOENGINEERING
author_facet BIOENGINEERING
Roy, M.
Sheppard, C.J.R.
Cox, G.
Hariharan, P.
format Article
author Roy, M.
Sheppard, C.J.R.
Cox, G.
Hariharan, P.
spellingShingle Roy, M.
Sheppard, C.J.R.
Cox, G.
Hariharan, P.
White-light interference microscopy: A way to obtain high lateral resolution over an extended range of heights
author_sort Roy, M.
title White-light interference microscopy: A way to obtain high lateral resolution over an extended range of heights
title_short White-light interference microscopy: A way to obtain high lateral resolution over an extended range of heights
title_full White-light interference microscopy: A way to obtain high lateral resolution over an extended range of heights
title_fullStr White-light interference microscopy: A way to obtain high lateral resolution over an extended range of heights
title_full_unstemmed White-light interference microscopy: A way to obtain high lateral resolution over an extended range of heights
title_sort white-light interference microscopy: a way to obtain high lateral resolution over an extended range of heights
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/67349
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