Wafer location integrity in aluminum metallization

10.1016/j.mee.2004.04.002

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Bibliographic Details
Main Authors: Ng, T.W., Lau, S.H.
Other Authors: BACHELOR OF TECHNOLOGY PROGRAMME
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/67815
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-678152023-10-25T20:14:28Z Wafer location integrity in aluminum metallization Ng, T.W. Lau, S.H. BACHELOR OF TECHNOLOGY PROGRAMME Position metallization aluminum Wafer metrology 10.1016/j.mee.2004.04.002 Microelectronic Engineering 75 2 172-176 MIENE 2014-06-18T05:09:39Z 2014-06-18T05:09:39Z 2004-08 Article Ng, T.W., Lau, S.H. (2004-08). Wafer location integrity in aluminum metallization. Microelectronic Engineering 75 (2) : 172-176. ScholarBank@NUS Repository. https://doi.org/10.1016/j.mee.2004.04.002 01679317 http://scholarbank.nus.edu.sg/handle/10635/67815 000223442000007 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Position metallization aluminum
Wafer metrology
spellingShingle Position metallization aluminum
Wafer metrology
Ng, T.W.
Lau, S.H.
Wafer location integrity in aluminum metallization
description 10.1016/j.mee.2004.04.002
author2 BACHELOR OF TECHNOLOGY PROGRAMME
author_facet BACHELOR OF TECHNOLOGY PROGRAMME
Ng, T.W.
Lau, S.H.
format Article
author Ng, T.W.
Lau, S.H.
author_sort Ng, T.W.
title Wafer location integrity in aluminum metallization
title_short Wafer location integrity in aluminum metallization
title_full Wafer location integrity in aluminum metallization
title_fullStr Wafer location integrity in aluminum metallization
title_full_unstemmed Wafer location integrity in aluminum metallization
title_sort wafer location integrity in aluminum metallization
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/67815
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