A comparative study of CCC and CUSUM charts

Quality and Reliability Engineering International

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Bibliographic Details
Main Authors:	Xie, M., Goh, T.N., Lu, X.S.
Other Authors:	INDUSTRIAL & SYSTEMS ENGINEERING
Format:	Review
Published:	2014
Subjects:	Average run length Cumulative counts CUSUM chart np-chart Sensitivity analysis Statistical process control
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/68077
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Institution:	National University of Singapore

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Summary:	Quality and Reliability Engineering International

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