Robustness monitoring for PID control systems

IECON Proceedings (Industrial Electronics Conference)

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Bibliographic Details
Main Authors: Ho, W.K., Wong, H.S., Han, H.P., Ni, L.Y.
Other Authors: ELECTRICAL ENGINEERING
Format: Review
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/68405
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Institution: National University of Singapore
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