A new similarity measure for deformable image registration based on intensity matching

10.1109/ISBI.2013.6556455

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Bibliographic Details
Main Authors: Lu, Y., Sun, Y., Liao, R., Ong, S.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/68932
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Institution: National University of Singapore

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