A novel UIO-based approach for fault detection and isolation in finite frequency domain

10.1109/ICCA.2009.5410522

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Bibliographic Details
Main Authors: Lum, K.Y., Xu, J., Xie, L., Loh, A.P.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/68994
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Institution: National University of Singapore