An iterative learning approach for local ramp metering

Proceedings of the IEEE International Conference on Control Applications

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Bibliographic Details
Main Authors: Hou, Z., Zhong, H., Xu, J.-X.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69345
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Institution: National University of Singapore
Description
Summary:Proceedings of the IEEE International Conference on Control Applications