Analysis of IBIS model performance in simulation of simultaneous switching noise

Analysis of IBIS model performance in simulation of simultaneous switching noise

Asia-Pacific Microwave Conference Proceedings, APMC

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Bibliographic Details
Main Authors: Ji, Y., Mouthaan, K., Venkatarayalu, N.V.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
gate modulation effect
IBIS
overestimation
simultaneous switching noise
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69392
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Institution: National University of Singapore
Description
Summary:Asia-Pacific Microwave Conference Proceedings, APMC

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