Blind estimation of residual carrier offset in OFDM systems

IEEE Workshop on Signal Processing Advances in Wireless Communications, SPAWC

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Bibliographic Details
Main Author: Attallah, S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69517
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Institution: National University of Singapore