Hong, Y., Yan, J., Wong, K., Yeow, Y., Chim, W., & ENGINEERING, E. &. C. (2014). Dopant profile extraction by inverse modeling of scanning capacitance microscopy using peak dC/dV.

Hong, Y.D., J. Yan, K.M Wong, Y.T Yeow, W.K Chim, and ELECTRICAL & COMPUTER ENGINEERING. Dopant Profile Extraction By Inverse Modeling of Scanning Capacitance Microscopy Using Peak DC/dV. 2014.

Hong, Y.D., et al. Dopant Profile Extraction By Inverse Modeling of Scanning Capacitance Microscopy Using Peak DC/dV. 2014.