Effect of in situ FIB trimming on the spin configurations of hexagonal-shaped elements characterized by SEMPA imaging

• Main Authors: Lua, S.Y.H., Kushvaha, S.S., Wu, Y.H., Teo, K.L., Chong, T.C.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Focused ion beam (FIB); Magnetic nanostructures; Scanning electron microscopy with polarization analysis (SEMPA); Vortex
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/70076
• Institution: National University of Singapore

10.1109/TMAG.2008.2002521