Effects of Co80 Fe20 insertion layer on perpendicular exchange bias characteristics in [PdCo]5 FeMn bilayered thin films

• Main Authors: Lin, L., Kim, S., Bae, S., Joo, H.W., Hwang, D.G., Lee, S.S.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/70094
• Institution: National University of Singapore

10.1063/1.2709420