Electrical transport study of patterned lateral niobium-permalloy junctions

10.1109/TMAG.2008.2001503

Saved in:
Bibliographic Details
Main Authors: Bakaul, S.R., Li, K., Han, G., Wu, Y.
Other Authors: PHYSICS
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70129
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first