Equivalent circuit model of on-wafer CMOS interconnects for RFICs

• Main Authors: Shi, X., Ma, J.-G., Yeo, K.S., Do, M.A., Li, E.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Empirical formulas; Lumped equivalent circuit model; Modeling; RF CMOS interconnects; Scalable; Scattering parameters measurement; Skin effect; Substrate losses
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/70195
• Institution: National University of Singapore

10.1109/TVLSI.2005.857177