Industrial fault detection and isolation using Dominant Feature Identification

• Main Authors: Pang, C.K., Zhou, J.-H., Zhong, Z.-W., Lewis, F.L.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Least Square Error (LSE); Neural Network (NN); Singular Value Decomposition (SVD)
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/70589
• Institution: National University of Singapore

ASCC 2011 - 8th Asian Control Conference - Final Program and Proceedings