Learning-based deformable registration using weighted mutual information

Proceedings - International Conference on Pattern Recognition

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Bibliographic Details
Main Authors: Lu, Y., Liao, R., Zhang, L., Sun, Y., Chefd'Hotel, C., Ong, S.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70787
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Institution: National University of Singapore