Log-likelihood metrics based on two-symbol-interval observations for LDPC codes with BDPSK transmission

10.1109/VETECF.2008.159

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Bibliographic Details
Main Authors: Mo, E., Pooi, Y.K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70822
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Institution: National University of Singapore