Multiple targets tracking by optimized particle filter based on multi-scan JPDA

Multiple targets tracking by optimized particle filter based on multi-scan JPDA

Conference Record - IEEE Instrumentation and Measurement Technology Conference

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Bibliographic Details
Main Authors: Jing, L., Vadakkepat, P.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
JPDA
MHT
Optimization
Particle Filter
Unknown Process Noises
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71058
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Institution: National University of Singapore
Description
Summary:Conference Record - IEEE Instrumentation and Measurement Technology Conference

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