Observation of a flux closure state in NiFe/IrMn exchange biased rings

• Main Authors: Guo, Z.B., Zheng, Y.K., Li, K.B., Liu, Z.Y., Luo, P., Shen, Y.T., Wu, Y.H.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/71191
• Institution: National University of Singapore

10.1063/1.1544498