On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz

10.1109/RFIT.2009.5383696

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Bibliographic Details
Main Authors:	Zhang, B., Xiong, Y.-Z., Wang, L., Teck-Guan, L., Zhuang, Y.-Q., Li, L.-W., Yuan, X.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/71218
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-712182023-10-27T08:09:45Z On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz Zhang, B. Xiong, Y.-Z. Wang, L. Teck-Guan, L. Zhuang, Y.-Q. Li, L.-W. Yuan, X. ELECTRICAL & COMPUTER ENGINEERING 10.1109/RFIT.2009.5383696 2009 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2009 284-287 2014-06-19T03:21:13Z 2014-06-19T03:21:13Z 2009 Conference Paper Zhang, B., Xiong, Y.-Z., Wang, L., Teck-Guan, L., Zhuang, Y.-Q., Li, L.-W., Yuan, X. (2009). On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz. 2009 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2009 : 284-287. ScholarBank@NUS Repository. https://doi.org/10.1109/RFIT.2009.5383696 9781424450312 http://scholarbank.nus.edu.sg/handle/10635/71218 000276343800071 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1109/RFIT.2009.5383696
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Zhang, B. Xiong, Y.-Z. Wang, L. Teck-Guan, L. Zhuang, Y.-Q. Li, L.-W. Yuan, X.
format	Conference or Workshop Item
author	Zhang, B. Xiong, Y.-Z. Wang, L. Teck-Guan, L. Zhuang, Y.-Q. Li, L.-W. Yuan, X.
spellingShingle	Zhang, B. Xiong, Y.-Z. Wang, L. Teck-Guan, L. Zhuang, Y.-Q. Li, L.-W. Yuan, X. On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz
author_sort	Zhang, B.
title	On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz
title_short	On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz
title_full	On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz
title_fullStr	On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz
title_full_unstemmed	On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz
title_sort	on the accuracy of de-embedding technologies for on-wafer measurement up to 170ghz
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/71218
_version_	1781783195925086208

On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz

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