Polarisation analysis of luminescence for the characterisation of defects in silicon wafer solar cells

Polarisation analysis of luminescence for the characterisation of defects in silicon wafer solar cells

10.1002/pip.1201

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Bibliographic Details
Main Authors: Peloso, M.P., Lew, J.S., Chaturvedi, P., Hoex, B., Aberle, A.G.
Other Authors: SOLAR ENERGY RESEARCH INST OF S'PORE
Format: Conference or Workshop Item
Published: 2014
Subjects:
defect
dislocation
luminescence
polarisation
silicon
solar cell
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71464
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/71464

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