Randomized locality sensitive vocabularies for bag-of-features model

10.1007/978-3-642-15558-1_54

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Bibliographic Details
Main Authors:	Mu, Y., Sun, J., Han, T.X., Cheong, L.-F., Yan, S.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/71544
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Institution:	National University of Singapore

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