Ho, H., Zheng, X., Phang, J., Balk, L., & ENGINEERING, E. &. C. (2014). Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification.
استشهاد بنمط شيكاغوHo, H.W., X.H Zheng, J.C.H Phang, L.J Balk, و ELECTRICAL & COMPUTER ENGINEERING. Reliable and Accurate Temperature Measurement Using Scanning Thermal Microscopy With Double Lock-in Amplification. 2014.
MLA استشهادHo, H.W., et al. Reliable and Accurate Temperature Measurement Using Scanning Thermal Microscopy With Double Lock-in Amplification. 2014.
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