Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification

Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification

10.1109/IRPS.2009.5173354

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Bibliographic Details
Main Authors: Ho, H.W., Zheng, X.H., Phang, J.C.H., Balk, L.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Double lock-in
Localized temperature
Scanning thermal microscopy
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71609
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/71609

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