Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification

10.1109/IRPS.2009.5173354

Saved in:

Bibliographic Details
Main Authors:	Ho, H.W., Zheng, X.H., Phang, J.C.H., Balk, L.J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Double lock-in Localized temperature Scanning thermal microscopy
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/71609
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-71609
record_format	dspace
spelling	sg-nus-scholar.10635-716092023-10-30T20:17:59Z Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification Ho, H.W. Zheng, X.H. Phang, J.C.H. Balk, L.J. ELECTRICAL & COMPUTER ENGINEERING Double lock-in Localized temperature Scanning thermal microscopy 10.1109/IRPS.2009.5173354 IEEE International Reliability Physics Symposium Proceedings 804-807 2014-06-19T03:25:42Z 2014-06-19T03:25:42Z 2009 Conference Paper Ho, H.W., Zheng, X.H., Phang, J.C.H., Balk, L.J. (2009). Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification. IEEE International Reliability Physics Symposium Proceedings : 804-807. ScholarBank@NUS Repository. https://doi.org/10.1109/IRPS.2009.5173354 0780388038 15417026 http://scholarbank.nus.edu.sg/handle/10635/71609 000272068100134 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Double lock-in Localized temperature Scanning thermal microscopy
spellingShingle	Double lock-in Localized temperature Scanning thermal microscopy Ho, H.W. Zheng, X.H. Phang, J.C.H. Balk, L.J. Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
description	10.1109/IRPS.2009.5173354
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Ho, H.W. Zheng, X.H. Phang, J.C.H. Balk, L.J.
format	Conference or Workshop Item
author	Ho, H.W. Zheng, X.H. Phang, J.C.H. Balk, L.J.
author_sort	Ho, H.W.
title	Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
title_short	Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
title_full	Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
title_fullStr	Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
title_full_unstemmed	Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
title_sort	reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/71609
_version_	1781783213069303808

Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification

Similar Items