Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
10.1109/IRPS.2009.5173354
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Main Authors: | Ho, H.W., Zheng, X.H., Phang, J.C.H., Balk, L.J. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/71609 |
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Institution: | National University of Singapore |
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