Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

10.1016/j.solmat.2011.05.022

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Bibliographic Details
Main Authors: Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Electrical defect
Electron Beam Induced Current
Morphological defect
Scanning Electron Acoustic Microscopy
Solar cell
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55673
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/55673

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