Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current
10.1016/j.solmat.2011.05.022
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2014
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sg-nus-scholar.10635-556732023-10-29T22:46:07Z Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current Meng, L. Nagalingam, D. Bhatia, C.S. Street, A.G. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING Electrical defect Electron Beam Induced Current Morphological defect Scanning Electron Acoustic Microscopy Solar cell 10.1016/j.solmat.2011.05.022 Solar Energy Materials and Solar Cells 95 9 2632-2637 SEMCE 2014-06-17T02:45:48Z 2014-06-17T02:45:48Z 2011-09 Article Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H. (2011-09). Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current. Solar Energy Materials and Solar Cells 95 (9) : 2632-2637. ScholarBank@NUS Repository. https://doi.org/10.1016/j.solmat.2011.05.022 09270248 http://scholarbank.nus.edu.sg/handle/10635/55673 000293161500014 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| topic |
Electrical defect Electron Beam Induced Current Morphological defect Scanning Electron Acoustic Microscopy Solar cell |
| spellingShingle |
Electrical defect Electron Beam Induced Current Morphological defect Scanning Electron Acoustic Microscopy Solar cell Meng, L. Nagalingam, D. Bhatia, C.S. Street, A.G. Phang, J.C.H. Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current |
| description |
10.1016/j.solmat.2011.05.022 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Meng, L. Nagalingam, D. Bhatia, C.S. Street, A.G. Phang, J.C.H. |
| format |
Article |
| author |
Meng, L. Nagalingam, D. Bhatia, C.S. Street, A.G. Phang, J.C.H. |
| author_sort |
Meng, L. |
| title |
Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current |
| title_short |
Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current |
| title_full |
Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current |
| title_fullStr |
Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current |
| title_full_unstemmed |
Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current |
| title_sort |
distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/55673 |
| _version_ |
1781412170499620864 |